X-Ray Fluorescence Analysis/Thickness ...

X-Ray Fluorescence Analysis/Thickness Gauges XRF XDL

Supplier: KK and S Instruments

X-Ray Fluorescence Analysis/Thickness Gauges XRF XDL

X-Ray Fluorescence Analasys/Thickness Gauges XRF XDL

X-Ray Fluorescence Analysis/Thickness Gauges XRF XDL

The XRF XDL defines nondestructive and contact free measurement of thickness and alloy composition of virtually any metallic coatings on any substrate material as well as material and solution analysis using the X-Ray fluorescence method.

94 Recent Views Call for more details

X-Ray Fluorescence Analysis/Thickness Gauges XRF XDL

Five instrument models which differ in measuring table and X-Ray head design are available:

Fixed test piece support plate with removable insert and fixed position X-Ray head
Manual X-Y stage and fixed position X-Ray head
Manual X-Y stage and motorized Z-axis travel X-Ray head
Programmable X-Ystage and fixed position X-Ray head
Programmable X-Y stage and programmable X-Ray head Z-axis travel

The XDL® features a unique method for distance correction of measurements. This DCM method (Distance Controlled Measurement) corrects automatically the intensity differences of fluorescence spectra at different measurement distances.

Using a XDL® with fixed position X-Ray head this feature offers the possibility for simple measurements on test pieces with complex geometry and different measuring areas distances.

To contact KK and S Instruments about X-Ray Fluorescence Analysis/Thickness Gauges XRF XDL use Get a quote.

X-Ray Fluorescence Analysis/Thickness Gauges XRF XDL

Five instrument models which differ in measuring table and X-Ray head design are available:

Fixed test piece support plate with removable insert and fixed position X-Ray head
Manual X-Y stage and fixed position X-Ray head
Manual X-Y stage and motorized Z-axis travel X-Ray head
Programmable X-Ystage and fixed position X-Ray head
Programmable X-Y stage and programmable X-Ray head Z-axis travel

The XDL® features a unique method for distance correction of measurements. This DCM method (Distance Controlled Measurement) corrects automatically the intensity differences of fluorescence spectra at different measurement distances.

Using a XDL® with fixed position X-Ray head this feature offers the possibility for simple measurements on test pieces with complex geometry and different measuring areas distances.

To contact KK and S Instruments about X-Ray Fluorescence Analysis/Thickness Gauges XRF XDL use Get a quote.

Let KK and S Instruments provide you with a quote

Supplier

Get a quote

Supplier: KK and S Instruments

Location: SOUTH WINDSOR, NSW

Is this your product? Manage products / company details |

Report this product

More from this supplier

See all 5 items

QuickTrack Welding Sensor

QuickTrack Welding Sensor

Fischerscope H100

Fischerscope H100

X-Ray Fluorescence Analysis/Thickness Gauges XRF XDL

X-Ray Fluorescence Analysis/Thickness Gauges XRF XDL

MPOR and MPOR-FP Coating thickness gauges

MPOR and MPOR-FP Coating thickness gauges

Compact Ultrasonic Cleaners FXP Series

Compact Ultrasonic Cleaners FXP Series

Contact KK and S Instruments

Thickness Gauge in Melbourne

Thickness Gauge in Adelaide

Thickness Gauge in Sydney

Thickness Gauge in Darwin

Thickness Gauge in Brisbane

Thickness Gauge in Perth

Are you a Thickness Gauge supplier?

Reach valuable industrial buyers in minutes

Promote key products & content

Drive cost effective & measurable sales

learn more