High precision analysis of alpha spectra from gridded ionisation chambers and semiconductor detectors (surface barrier, PIPS, ULTRA and other ion implanted detectors)
Ability to accurately deconvolute very closely lying peaks such as the peaks from the Pu239 and Pu240 multiplet.
Uses the peak shape functions derived from the physics of interactions between emission and registration for the deconvolution of alpha spectra from silicon semiconductor and gridded ionisation chamber detectors
Provides reliable quantitative analysis of: